Environmental Testing

IJ R&D Center is a specialized reliability testing facility producing high quality results for high customer satisfaction.

HOMEReliability Test ClassificationsEnvironmental Testing

Environmental Testing

High Temperature Operation Test

Test to verify product can perform or function normally at extremely high temperatures for an extended period of time

Low Temperature Operation Test

Test to verify product can perform or operate normally at extremely low temperatures for an extended period of time

Power Application Test at High Temperature/ Humidity

Test to verify product can perform or operate normally at extremely high temperatures and high humidity for an extended period of time

Temperature and Humidity Cycling Test

Test to verify product can perform or function normally when stored and operated under extremely high temperature, high humidity, and low temperature environments for an extended period of time

Humidity Test

Test to verify product can perform or function normally when stored under high humidity conditions

Dew Condensation Test

Test to verify product can function normally with data before and after condensation conditions created with the Constant Temperature & Humidity Chamber

Temperature Test

Test to verify product can perform or function normally under changes in temperature, exposing product at room temperature, low temperature, high temperature at one hour intervals

Salt Spray Test

Test to verify product can perform or function normally when left or used in salt spray conditions for a certain period of time

High Temperature Operation Endurance Test

Test to verify product can perform or function normally when used under high temperature conditions for an extended period of time

Thermal Shock Test

Test to evaluate the damage to automobile parts due to the difference in parts’ thermal expansion coefficient caused by abrupt temperature changes

High/Low Temperature Operational Limits Test

Test to evaluate critical temperatures to keep as data to use in case of future field defects